Development of Wavelength-Dispersive X-ray Spectrometer for a Conventional Analytical Transmission Electron Microscope

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)

The development of a wavelength-dispersive spectrometer for microfluorescence analysis at the X-ray Microscopy ID21 beamline of the European Synchrotron Radiation Facility (ESRF) is reported. The spectrometer is based on a polycapillary optic for X-ray fluorescence collection and is operated in a flat-crystal geometry. The design considerations as well as operation characteristics of the spectr...

متن کامل

CHAPTER 4 pgINCIPLES OF X - RAY ENERGY - DISPERSIVE SPECTROMETRY IN THE ANALYTICAL ELECTRON MICROSCOPE

INSTRUMENTATION The EnergyDispr5jy Spectrometer The Solid state x-ray detector or energy-dispersive spectrometer (EDS) was 1°Ped in the late l960s and rapidly found use on electron-beam instruments rald er a!., 1968) because of its speed in collecting and simultaneously displaying da from a wide energy range. Its small size, but relatively large collection angle 123 Authors Copy

متن کامل

Low-cost virtual instrumentation system of an energy-dispersive X-ray spectrometer for a scanning electron microscope

The paper describes an energy-dispersive X-ray spectrometer for a scanning electron microscope (SEM-EDXS). It was constructed using the new architecture of a virtual instrument (VI), which is low-cost, space-saving, fast and flexible way to develop the instrument. Computer-aided teaching (CAT) was used to develop the instrument and operation rather than a traditional instrument technique. The V...

متن کامل

Decomposition of Wavelength Dispersive X-Ray Spectra

Line shapes of atomic lines and soft x-ray emission bands measured with a wavelength dispersive spectrometer (WDS) with the Electron Probe Micro Analyzer (EPMA) are reviewed. Least square fitting to pseudo-Voigt profiles of the digitally measured spectra are used to account for the presence of non-diagram features (high and low energy satellites) and instrumental induced distortions. The effect...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Microscopy and Microanalysis

سال: 2006

ISSN: 1431-9276,1435-8115

DOI: 10.1017/s1431927606067444